Very-Large-Scale Integration Design

Transactions on Very Large Scale Integration ( Vlsi

Transactions on Very Large Scale Integration ( Vlsi

Functional yield is a term used to describe the percentage of dies on a wafer that are not affected by catastrophic defects. Within the interconnect these defects are usually caused by particle contamination and are divided into bridging defects, which join adjacent wires and cuts, which result in broken wires. Functional yield is therefore determined by the geometry of the routing channels, ho...

Very-Large-Scale Integration Of Electronic Circuits

This chapter aims to offer the reader a comprehensive view about what we understand nowadays under the term VLSI. Within the Introduction, a historical perspective is given first, describing how the term has evolved from integrated circuits with hundred thousand transistors to integrated systems in the range of billions of devices including on-chip or on-package sensors. Then, the main topics h...

Transactions on Very Large Scale Integration

we proposed a new adder design, called VariableLatency Adder (VL-adder). This technique allows the adder to work at a lower supply voltage than that required by a conventional adder, while maintaining the same throughput. The VL-adder design can be further modified to overcome the effects of Negative Bias Temperature Instability (NBTI) on circuit delay. By applying VL-adder concept to 64-bit ca...

2 Ieee Transactions on Very Large Scale Integration ( Vlsi

1 Computing Lower Bounds on Functional Units Before Scheduling1 Samit Chaudhuri2, Robert A. Walker3 Abstract|This paper presents a new polynomial-time algorithm for computing lower bounds on the number of functional units (FUs) of each type required to schedule a data ow graph in a speci ed number of control steps. A formal approach is presented that is guaranteed to nd the tightest possible bo...